Title: Security versus Test and Reliability: The Crossroads and Beyond

Speaker: Swarup Bhunia, University of Florida

Abstract:
Security has emerged as a critical design parameter for modern electronic hardware that promises exciting new applications from smart wearables to smart cities. However, recent discoveries and reports on numerous security attacks in microchips and circuits violate the well-regarded concept of hardware trust anchors. It has prompted system designers to develop wide array of design-for-security and test/validation solutions to achieve high security assurance. At the same time, emerging security issues and countermeasures have also led to interesting interplay between security, test/validation and reliability. Hardware faults and parametric variations, on one hand, have created new security vulnerabilities or barrier to establishing hardware integrity in ever-complex semiconductor supply chain. On the other hand, reliability issues – in particular, those induced by process variations and aging effects, create new opportunities in designing powerful security primitives to protect against diverse supply chain security issues as well as enable better functional security solutions. This keynote will highlight the interaction of hardware security issues and protection mechanisms with hardware faults/reliability and the test/validation solution. It will present new frontiers in hardware security with the rapidly diversifying application space and their symbiosis as well as conflicts with test.

Bio:
Swarup Bhunia received his B.E. (Hons.) from Jadavpur University, Kolkata, India, M.Tech. from the Indian Institute of Technology (IIT), Kharagpur, and Ph.D. from Purdue University, IN, USA. Currently, Dr. Bhunia is a preeminence professor of Computer Engineering in the University of Florida, FL, USA. Earlier he was appointed as the T. and A. Schroeder associate professor of Electrical Engineering and Computer Science at Case Western Reserve University, Cleveland, OH, USA. He has over ten years of research and development experience with over 200 publications in peer-reviewed journals and premier conferences and six authored/edited books. His research interests include hardware security and trust, adaptive nanocomputing and novel test methodologies. Dr. Bhunia received IBM Faculty Award (2013), National Science Foundation career development award (2011), Semiconductor Research Corporation Inventor Recognition Award (2009), and SRC technical excellence award (2005) as a team member, and several best paper awards/nominations. He is co-founding editor-in-chief of a Springer journal on hardware and systems security. He’s cofounder of a startup Hakham Systems which aims at developing hardware security education platforms. He has been serving as an associate editor of IEEE Transactions on CAD, IEEE Transactions on Multi-Scale Computing Systems, ACM Journal of Emerging Technologies, and Journal of Low Power Electronics; served as guest editor of IEEE Design & Test of Computers (2010, 2013) and IEEE Journal on Emerging and Selected Topics in Circuits and Systems (2014). He has served as co-program chair of IEEE IMS3TW 2011, IEEE NANOARCH 2013, IEEE VDAT 2014, and IEEE HOST 2015, and in the program committee of several IEEE/ACM conferences. He is a senior member of IEEE.