Call for contributions

Call for papers

PDF Version

Abstract submissions April 24, 2020
Full paper submissions May 8, 2020
Notification July 3, 2020
Camera ready and author's registration July 31, 2020

 

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation ar e of interest. Topics include (but are not limited to) the following:

      • Yield Analysis and Modeling
        Defect/fault analysis and models; statistical yield modeling; diagnosis; critical area and other metrics.
      • Testing Techniques
        Built-in self-test; delay fault modeling and diagnosis; testing for analog and mixed circuits; online testing; signal and clock integrity.
      • Design For Testability in IC Design
        FPGA, SoC, NoC, ASIC, low power design and microprocessors.
      • Error Detection, Correction, and Recovery
        Self-testing and self-checking solutions; error-control coding; fault masking and avoidance; recovery schemes, space/time redundancy; hw/sw techniques; architectural and system-level techniques.
      • Dependability Analysis and Validation
        Fault injection techniques and frameworks; dependability and characterization.
      • Repair, Restructuring and Reconfiguration
        Repairable logic; reconfigurable circuit design; DFT for on-line operation; self-healing; reliable FPGA-based systems.
      • Defect and Fault Tolerance
        Reliable circuit/system synthesis; fault tolerant processes and design; design space exploration for dependable systems, transient/soft faults.
      • Radiation effects
        SEEs on nanotechnologies; modeling of radiation environments; radiation experiments; radiation hardening techniques.
      • Aging and Lifetime Reliability
        Aging characterization and modeling; design and run-time reliability, thermal, and variability management and recovery.
      • Dependable Applications and Case Studies
        Methodologies and case studies for IoTs, automotive, railway, avionics and space, autonomous systems, industrial control, etc.
      • Emerging Technologies
        Techniques for 2.5D/3D ICs, quantum computing architecttures, memristors, spintronics, microfluidics, etc.
      • Design for Security
        Fault attacks, fault tolerance-based countermeasures, scan-based attacks and countermeasures, hardware trojans, security vs. reliability trade-offs, interaction between VLSI test, trust, and reliability.