IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems
 IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems

Call for demos

DFT is a specialist symposium with delegates from industry and academia, and as such it is a good opportunity especially for academic researchers to promote their tools and prototypes, and network with the leading experts in relevant fields.

This year DFT will provide researchers with the opportunity to demonstrate their research outcome and products (including software design automation tools, simulators, hardware prototypes, etc.), as a complementary presentation to the regular paper sessions and industrial demos. These demos will take place during coffee breaks.

DFT organizing committee seeks proposals from universities for these demos covering any topic of interest within the remits of the symposium topics (refer to the call for papers). Demos can be different from accepted papers, aim of this session is to provide opportunity for early feedback and raising awareness of a developed research idea.

Proposal submission

Prospective presenters should submit a 1-page (double column IEEE format) extended abstract of the demo, specifying the title, the list of authors and their affiliation. Proposals have to be submitted by email to both the Program co-Chairs:

  • Antonio Miele - antonio dot miele at polimi dot it
  • Saqib Khursheed - S dot Khursheed at liverpool dot ac dot uk

All presenters and participants will have to register to attend DFT 2017. However, there is no separate fee for demo presentation.

Submission deadline: August 4, 2017 September 9, 2017.


Hardware/software prototypes will be demonstrated on desks with your own laptop and/or other equipment, supported by an A0/A1 poster. DFT organizers will provide the following to each demo presenter:

  • a table
  • a poster stand
  • a power plug for your laptop, hardware prototype, etc.
  • WiFi connection

Further information will be provided to prospective presenters.