Welcome to the website of the 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2008.

This year the Symposium will be held in Cambridge (MA) USA in an area with one of the highest concentrations of research and academic insitutions in the world.

A view of Boston from the harbor

Held in conjunction with the 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS)