Welcome!

Welcome to the website of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2011.

This year the Symposium will be back in Vancouver in British Columbia, Canada, as in 2002 (link to the DFT 2002 website).

Latest news

Sep
2
Deadline for special room rates extension: Sep. 6, 2011
 
Aug
30
Advance technical program available.
 
Aug
4
Hotel reservation now available. Information on the hotel page.
Deadline for special room rates: Sep. 2, 2011
 
Jul
30
Registration is now open. Instructions on the registration page.
 
Jul
21
Authors' kit now available. Instructions on the submission page.              
 
Jun
29
Notification of acceptance postponed, due to submission deadline extension.
 
May
16
The "Journal of Electronic Testing: Theory and Applications" (JETTA), published by Springer, will host a Special Issue for papers accepted at DFT 2011.
 
Apr
28
Submission deadline extended. Please register your paper (authors, title, etc.) on the submission site to get the one-week extension.
 
Apr
27
The submission site is now open at
http://www.molesystems.com/welcome/tttc/DFT/2011/
 

Special Issue in Journal of Electronic Testing: Theory and Applications (JETTA, Springer)

A Special Issue for papers accepted at DFT 2011 will be hosted in JETTA Journal, allowing authors to submit an extended version of their work.

2011 Best Student Paper Award

All papers with a student as both primary author and presenter are automatically taken into consideration for the 2011 Best Student Paper Award, sponsored by Intel.
Though it is not required for consideration, feel free to remind us of your eligibility by sending an email to the Program co-Chairs.

Important Dates

  • Submission deadline: May 7, 2011 May 14, 2011 (23:59 GMT)
  • Acceptance notification: June 29, 2011 July 8, 2011
  • Camera ready and author's registration deadline: August 5, 2011