DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
A detailed list of the topics of interest is available here.
For its 30th edition DFT is coming to Europe and to Cambridge, UK.
The CfP for the special issue in the IET Computers & Digital Techniques journal is now available (the flier is available here). Please consider this opportunity to submit an extended version of your DFT-2017 paper. You are certainly welcome to submit another relevant work, not previously submitted to DFT-2017.
Please find all information here.