welcome to DFT 2016
29th edition of the Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium

DFT (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems) is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.

More information will be available soon!