DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
A detailed list of the topics of interest is available here.
For its 30th edition DFT is coming to Europe and to Cambridge, UK.
Registration and camera ready
Registration website is now open. More information is available here.
For camera ready preparation, click here.
Author registration and camera ready submission deadline: August 4, 2017
Call for demos
This year DFT will give the opportunity to participants to demonstrate their research outcome in a demo session. More information is available here.