DFT (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems) is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.
DFT Symposium is sponsored by:
- the IEEE Computer Society
- the IEEE Fault-Tolerant Computing Technical Committee
- the IEEE Test Technology Technical Council
The conference is organized by Delft University.