IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems
  
 IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems
  

Welcome to DFT 2017 in Cambridge, UK

 

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

A detailed list of the topics of interest is available here.

For its 30th edition DFT is coming to Europe and to Cambridge, UK.

Highlights

Call for demos

This year DFT will give the opportunity to participants to demonstrate their research outcomes and products in demo sessions. More information are available at here.

Keynote and invited speeches

  • Peter Harrod, from ARM
  • Erik Jan Marinissen, from IMEC
  • Prof. Gang Qu, from the University of Maryland
  • Prof. Krishnendu Chakrabarty, from the Duke University
More information will soon be available here.

Sponsored by