16th IEEE Symp. Defect and Fault Tolerance in VLSI and Nanotechnology Systems
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.
The technical sessions of the symposium will be held on October 2-4, 2013, within the scenario of the NYU-Abu Dhabi premises in Washington Square.
This year the event will be located in the Greenwich Village (also known as "the Village") in Manhattan, New York.
|09/07/2013||Intel sponsors Best Student Paper @ DFT 2013!|
|08/23/2013||Early registration deadline extended till Sep. 1st|
|08/23/2013||Preliminary technical program now available|
|07/29/2013||Registration site now open|
|07/18/2013||Easychair website open for camera ready upload|
|07/05/2013||Paper notifications sent out|
|06/20/2013||Paper notification postponed to July 3, due to deadline submission extension|
|05/15/2013||Paper submission deadline extended to May 17, 2013|
|04/20/2013||Final call for paper available|
|04/05/2013||Easychair website open for submissions|
|03/15/2013||Preliminary call for paper available|