IEEE Defect and Fault Tolerance
in VLSI and Nanotechnology Systems Symposium
  
IEEE Defect and Fault Tolerance
in VLSI and Nanotechnology Systems Symposium
  

Welcome to DFT 2017 in Cambridge, UK

 

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.

For its 30th edition DFT is coming to Europe and to Cambridge, UK.

For information on the conference, please contact the program co-chairs.


credits: Tawfique Hasan (Cambridge)


credits: Tawfique Hasan (Cambridge)

Latest news

DEC
06
2017
Updated webite
DFT 2017 website available