Session Chair: Elena-Ioana Vatajelu
Safety and Security Assessment through X-Ray Illumination
Session Chair: Paolo Maistri
Reliability of Microcontrollers in Radiation Harsh Environment at Different Levels of Abstraction. The Case Study of the HARV RISC-V SoC
Session Chair: Luigi Dilillo
Towards AI-based cross-layer resilience: from reliability estimation at design phase to in-field error detection and on-chip sensor data processing
Session Chair: Mihalis Psarakis
Resilience of Brain-Inspired Applications: Test and Reliability for Modern ML and AI Hardware Implementations
Session Chairs: Elena-Ioana Vatajelu and Ernesto Sanchez