IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems
  
 IEEE Int. Symposium on Defect and Fault Tolerance
 in VLSI and Nanotechnology Systems
  

Registration

Type Author registration Early registration Late/on site registration
(by August 4) (by September 9) (from September 10)
Regular IEEE Member £ 480 £ 480 £ 540
Regular Non-Member £ 510 £ 510 £ 570
Student IEEE Member -- £ 360 £ 420
Student Non-Member -- £ 420 £ 480
Life/Retired IEEE Member -- £ 480 £ 540

Author/delegate registration includes admission to technical sessions, refreshment breaks, lunches, one social event ticket, one social dinner ticket and an electronic copy of the proceedings. Additional guest tickets for social event or dinner can be purchased during registration.

NOTE: Student status must be verified by emailing a copy of a valid student card or a letter from the university to Rishad Shafik at Rishad.Shafik@ncl.ac.uk

At least one AUTHOR for each accepted paper is required to register as a REGULAR attendee (Regular IEEE Member or Regular Non-Member) and pay his/her fee before August 4, 2017. When registering, please refer to the submission PAPER ID. Papers will not be published in the proceedings unless one of the authors has registered (as REGULAR) and payment of the registration fee has been received.

Payment

This link will take you to the registration page. You are required to create an account with all necessary details.